scanning electron microscope philips 505 Search Results


cross sectional transmission electron microscopy xtem  (JEOL)
99
JEOL cross sectional transmission electron microscopy xtem
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Cross Sectional Transmission Electron Microscopy Xtem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/JEM-2100F+Transmission+Electron+Microscope/pmc06911103-48-23-30
Average 99 stars, based on 1 article reviews
cross sectional transmission electron microscopy xtem - by Bioz Stars, 2026-09
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bioscan digital micrograph  (Gatan Inc)
97
Gatan Inc bioscan digital micrograph
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Bioscan Digital Micrograph, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/DigitalMicrograph+Software/pm17579207-192-16-19
Average 97 stars, based on 1 article reviews
bioscan digital micrograph - by Bioz Stars, 2026-09
97/100 stars
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electron microscope  (Marburg GmbH)
90
Marburg GmbH electron microscope
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Electron Microscope, supplied by Marburg GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/electron+microscope/pm38600380-863-59-54
Average 90 stars, based on 1 article reviews
electron microscope - by Bioz Stars, 2026-09
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fesem  (JEOL)
97
JEOL fesem
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Fesem, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/JSM-6360A_6360LA+Scanning+Electron+Microscope/10__1039_slash_c6ra27415c-61-16-19
Average 97 stars, based on 1 article reviews
fesem - by Bioz Stars, 2026-09
97/100 stars
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high resolution transmission electron microscopy hrtem  (JEOL)
98
JEOL high resolution transmission electron microscopy hrtem
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
High Resolution Transmission Electron Microscopy Hrtem, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/JSM-IT800+Scanning+Electron+Microscope/10__1016_slash_j__apsusc__2025__164466-64-21-16
Average 98 stars, based on 1 article reviews
high resolution transmission electron microscopy hrtem - by Bioz Stars, 2026-09
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jsm 6460lv field emission scanning electron microscope fe sem  (JEOL)
96
JEOL jsm 6460lv field emission scanning electron microscope fe sem
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Jsm 6460lv Field Emission Scanning Electron Microscope Fe Sem, supplied by JEOL, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/JSM-6460_6460LV+Scanning+Electron+Microscope/pmc07138897-95-6-17
Average 96 stars, based on 1 article reviews
jsm 6460lv field emission scanning electron microscope fe sem - by Bioz Stars, 2026-09
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jem 2100  (JEOL)
99
JEOL jem 2100
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Jem 2100, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/JEM-2100+Transmission+Electron+Microscope/10__1016_slash_j__actamat__2019__07__001-92-17-19
Average 99 stars, based on 1 article reviews
jem 2100 - by Bioz Stars, 2026-09
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transmission electron microscope tem  (JEOL)
99
JEOL transmission electron microscope tem
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Transmission Electron Microscope Tem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/JEOL-IDES_Products+Transmission+Electron+Microscope/10__33263_slash_briac132__192-63-13-16
Average 99 stars, based on 1 article reviews
transmission electron microscope tem - by Bioz Stars, 2026-09
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scanning electron microscope  (Philips Healthcare)
86
Philips Healthcare scanning electron microscope
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Scanning Electron Microscope, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 86 stars, based on 1 article reviews
scanning electron microscope - by Bioz Stars, 2026-09
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depositor microscope fei philips cm200feg depositor voltage kv 120 depositor electron dose  (Philips Healthcare)
86
Philips Healthcare depositor microscope fei philips cm200feg depositor voltage kv 120 depositor electron dose
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Depositor Microscope Fei Philips Cm200feg Depositor Voltage Kv 120 Depositor Electron Dose, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Average 86 stars, based on 1 article reviews
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transmission electron microscopy  (Philips Healthcare)
86
Philips Healthcare transmission electron microscopy
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Transmission Electron Microscopy, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/electron+microscopy+transmission/pm28133456-61-6-12
Average 86 stars, based on 1 article reviews
transmission electron microscopy - by Bioz Stars, 2026-09
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transmission electron microscopy tem  (Philips Healthcare)
86
Philips Healthcare transmission electron microscopy tem
( a ) Cross-sectional transmission electron <t>microscopy</t> <t>(XTEM)</t> image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.
Transmission Electron Microscopy Tem, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/scanning+electron+microscope+philips+505/tem/pmc12940697-157-3-8
Average 86 stars, based on 1 article reviews
transmission electron microscopy tem - by Bioz Stars, 2026-09
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Image Search Results


( a ) Cross-sectional transmission electron microscopy (XTEM) image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.

Journal: Scientific Reports

Article Title: Engineering of self-rectifying filamentary resistive switching in LiNbO 3 single crystalline thin film via strain doping

doi: 10.1038/s41598-019-55628-3

Figure Lengend Snippet: ( a ) Cross-sectional transmission electron microscopy (XTEM) image of the virgin sample, ( b – d ) the indexed selected area electron diffraction (SAED) patterns taken from the area of the top, middle and bottom of the LNO thin film in the virgin sample, respectively. ( e ) XTEM image of the sample with He implantation fluence of 1E14 cm −2 , ( f – h ) the indexed SAED patterns taken from the area of the top, middle and bottom of the LNO thin film in the sample with He implantation fluence of 1E14 cm −2 , respectively.

Article Snippet: The crystalline quality and microstructure of the LNO thin film were examined by X-ray diffraction (XRD) with a Philips X’Pert X-ray diffractometer and cross-sectional transmission electron microscopy (XTEM) with a JEOL 2100 F field-emission transmission electron microscopy.

Techniques: Transmission Assay, Electron Microscopy